Takahiro Tate

Takahiro Tate

Staff Test Engineer @ OMNIVISION

About

●23 years of experience in test development. It is a series of operations from product debugging to mass production introduction and mass production support. ● <Owned skills>Creation of test specifications, jig and tool specifications, test programs, and pattern programs.  <Tester skills>T6371,T6372,T6373,T6391,T6577,V93000,TS6000H,TS6700,ST6730 <Product classification>DDIC, TDDI, OLED, VR, LDO, MOTOR DRIVER, PRINTER-HEAD DRIVER, LED DRIVER,Audio-IC, ZigBee, Bluetooth ●Automating tasks with scripts (VBA, Perl).

Country

Japan

City

Tokyo

Industry

Electrical & Electronic Manufacturing

Skill

エスカレーションサポート, エンジニアリングサポート, T2000,, T6391, VR, OLED, TDDI, DDIC, テストプログラム開発, 量産導入, 不良解析, テスト自動化, テスト計画, Perl, ADVANTEST, 妥当性検証

Experience

OMNIVISION

Staff Test Engineer

OMNIVISION

LinkedIn
2025-1 - Present · 1 yr 9 mos

新横浜

Advantest

Escalation Engineer

Advantest

LinkedIn
2023-10 - 2024-12 · 1 yr 3 mos

日本 群馬県

I belong to a field service global support team with extensive specialized knowledge. We provide support at a team level, regardless of the escalation level of the issue, to meet the needs of our customers. Drawing on past experiences, I am capable of providing support not only for hardware but also for software.

Synaptics Incorporated

Senior Test Engineer

Synaptics Incorporated

LinkedIn
2017-1 - 2023-9 · 6 yrs 9 mos

東京 中野

■Test Development Department   Test development and validation and mass production introduction. ・Examination of tester configuration, estimation of mass production test time  ・Tester tooling (wafer, COF) specification design  ・Test program creation, debugging, reduction of test time  ・Characteristic evaluation, defect analysis, and introduction to mass production DDIC, TDDI, OLED, VR, TDDI_AUTO T6371,T6372,T6373,T6391

株式会社カトム

主任

株式会社カトム

2000-4 - 2016-12 · 16 yrs 9 mos

日本 東京都

■Test Development Department(Temporary staffing and outsourcing)   Test development and validation and mass production introduction. ・Examination of tester configuration, estimation of mass production test time  ・Tester tooling (wafer, COF) specification design  ・Test program creation, debugging, reduction of test time  ・Pattern program creation  ・Characteristic evaluation, defect analysis, and introduction to mass production ・Convert (test program, pattern program) DDIC, TDDI, LDO, MOTOR DRIVER, PRINTER-HEAD DRIVER, LED DRIVER,Audio-IC, ZigBee, Bluetooth, Low power micon T6371,T6372,T6373,T6391,V93000,TS6000H,TS6700,ST6730

Takahiro Tate's Contact Information

Email

******@***.com

Phone

(**) *** ****

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