james quigley

Responsible for improving and extending cutting edge video analysis algorithms in C and C++ for insertion of ads into streaming video. Greatly improved the object tracking portion of these algorithms. Added an extendable object classification module to the algorithms for possible future applications. Responsible for python scripts integrating the C/C++ algorithm executables into Keystream’s fully automated web service.

Designed and wrote the runtime data analysis package for an X-Ray based semiconductor metrology tool using MATLAB. This package was designed as a modular toolbox allowing quick set up of appropriate analyses and the rapid deployment of new algorithms. This package includes tools for calculating spectral intensities, measuring film thicknesses, determining atomic compositions and evaluating various derived quantities. These tools account for noise in the input spectra and produce stable results with high precision and accuracy. Developed methods for calibrating results across platform generations.

Led a project to study the feasibility of improving defect detection and noise suppression algorithms by replacing a custom image computer with programmable off-the-shelf image processing hardware. Led a project to evaluate optical means of suppressing noise for next generation wafer inspection systems. Ran competitive evaluations of wafer inspectors at customer sites including Samsung, Toshiba, AMD and Micron. Led demos of inspection systems for critical customers including Intel, Samsung, TI, Micron and Toshiba.

Developed and documented improved techniques for user optimization of sensitivity and noise suppression parameters for bright-field optical wafer inspectors. Helped to develop algorithms for automated optimization of sensitivity parameters for optical wafer inspection systems. Developed a training package to help users of previous systems make the transition to the new system and algorithms.

Responsible for characterization of advanced image based defect detection and noise suppression algorithms from bright-field optical wafer inspectors.

Worked in a team environment to develop and debug a control program for an automated optical wafer inspection system using C and C++.

Analyzed the leptonic decay spectra of the tau lepton. Studied and modeled detector and background noise affecting these spectra. Developed software to fit the spectra accounting for the noise and extract values for the Michel parameters. Presented the results at international conferences and wrote papers for journal publication.

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Thesis work performed at SLAC 1992-1996"]