璐周

Firmware Test Architecture @ Microchip Technology Inc.

About

Responsible, self-motivated and efficient; With great passion and interest in cutting-age technologies, willing to take challenges and initiatives, quick learner; 15 years’ experience in storage industry, including 8 years’ experience in SSD product; 4 years’ experience in NVMe/PCIe controller firmware test development; Proficient in software test, firmware test and CI/CD infrastructure architecture; Good leadership ability, solid global teamwork experience, with a sense of customer-oriented; Familiar with NVME Spec 1.3/1.4, PCIe Spec 4.0; Familiar with NAND properties and Flash solutions; Proficient in Python; familiar with other script languages like TCL, Shell; familiar with C/C++; Excellent programming skill, strong trouble shooting, problem analysis and debugging capability; Proficient in Jenkins automation setup, including pipeline job design; Rich project experience in both enterprise and client products; Familiar with Cadence Protium test platform (FPGA-based emulation and prototyping equipment); Familiar with Code Coverage Tool Bullseye; Familiar with development and management tools including Git, Bitbucket, JIRA, Confluence, JIRA Test Plug-ins like Zephyr, Xray and know how to automate JIRA operations with HTTP REST APIs; Fluent in both written and spoken English, with effective communication skills. Rich experience in co-working with global teams locating in multiple time zone.

Country

China

City

Shanghai

Industry

Computer Hardware

Skill

嵌入式 Linux, 自动化, Jenkins 集成平台, 计划管理, 测试, 综合, 领导力, 自动化软件测试, Python, 固件, 存储

Experience

Firmware Test Architecture

Microchip Technology Inc.

2018-7 - Present · 8 yrs 3 mos

中国上海市

NVMe flash controller and PCIe switch controller firmware test design, automation framework architecure, CI/CD design

FTE Technical Lead

Micron Technology

2014-12 - 2018-6 · 3 yrs 7 mos

中国上海

TLC SSD was new technology in 2015, it uses 3D NAND to reduce bit-per-cell cost in solid state drive products. Micron's TLC SSD products were driven by Micron's own firmware, which needs to be tested thoroughly. Bugs should be found as early as possible to reduce risks and cost. The team I lead focuses on L1 testing, which contains white-box and grey-box tests to ensure firmware has decent quality before moving to downstream testing teams. Acted as the Technical Leader, I have led the FTE testing team to successfully delivered Micron’s first TLC SSD drive MX300 (client product, shipped in 2016), and Micron’s latest and best-performance TLC SSD drive 5200 (enterprise product, shipped in 2018).

Senior Test Development Engineer

IBM

2007-4 - 2014-11 · 7 yrs 8 mos

中国上海

RAID adapter is the core I/O functional part of storage. Banks are major customers of high-end storage and they require high reliability and high performance. The team’s target is to ensure there is no unexpected breakage in the I/O path, no slow or dropped data transaction, no loss of access to volumes. DVT stands for Design Verification Test, so the testers must know the design points of the firmware, and build Whitebox test scenario to cover critical code paths. Acted as test architecture and team lead, I have led the DVT team to have delivered multiple good quality firmware releases in time and provided solid test support for field hot issues.