苏婕 苏
SMIC CE @ SMIC
-
China
Semiconductors
-
Experience
Customer Engineering
SMIC
BJ
Failure analysis engineer
SMIC
BJ & SH
Paper (First author and co-coworker): a. Electrical Signature Verification of a Lightly Doped Drain Profile Abnormality in a 65nm Device via Nano-Probing and Junction Stain TEM. 35th International Symposium for Testing and Failure Analysis November 17-19, 2009, McEnery Convention Center, San José, California, USA b. Al Pad Corrosion Mechanism Study when Dicing Saw. 33rd International Symposium for Testing and Failure Analysis. November 4-8, 2007, McEnery Convention Center, San José, California, US
Education
Central South University
Material Science and Engineering
苏婕 苏's Contact Information
Phone
Find the Right Leads
Find Verified Contact Data
What LeadContact does well
Find verified emails, phone numbers, and decision-makers with 98% accuracy.
Find Leads
Find the right people by company, role, industry, location, and more.
925M+ professional profiles
Find Emails
Access verified email addresses for your target contacts.
657M+ emails
Find Phone Numbers
Get cross-validated phone data from multiple top sources.
239M+ phone numbers
More Accurate. Lower Cost.
Find contact data in 1 tool with 98% accuracy
LeadContact integrates leading enrichment tools to deliver more accurate contact data—without paying for each one.
Great conversations start with the right contact.
It’s time to find yours.