Nobel Yang

2011.07-2013.07 Expatriated in Singapore Micron Semiconductor Asia Pte. Ltd. 1. Own DRAM and FLASH memory test program development, work very closely with design engineers/quality&reliability engineers/application engineers for failure analysis, performance characterization and device issue debug to determine the root cause and provide solution. 2. Understand tester platform, test condition and test method for the memory product and generate defined test items and test flow for both characterization and volume testing needs. 3. Run yield and test time analysis to get a lowest cost test method in order to reach short test time and high testing coverage and yield. 4. Develop/define/improve testing method to deal with new product introduced from design to marketing. 5. Deliver a world class throughput time on the testing code development to reach fastest way of sample delivery. 6. Work with multiple & international teams to complete assigned projects in product development team required time. 7. Work with cross function and region teams to share the latest issues, methods and solutions for the benefit of current and future product development.

1. Develop and release SLT test program for mass production 2. Develop Engineering program to support product engineering activities 3. Develop and implement new methodologies to support quality goals 4. Drive new production technology and integration projects from development into production 5. Identify test time reduction opportunities and execute TTR 6. Test issue debugging and solution providing 7. Early involvement in silicon execution phase including test coverage evaluation, test flow integration and test hardware qualification 8. Support productivity, yield and cost improvement programs