
lev makutonin
defect inspection and metrology engineer
About
Senior process and equipment engineer with 20+ years experience in semiconductors industry. Specialties: Bright field and dark field inspection, EBeam inspection and SEM review, metrology and yield enhancement. application development, process and field service support.
united states
durham
semiconductors
semiconductors, metrology, semiconductor industry, failure analysis, spc, yield, silicon, r&d, jmp, cvd, optics, characterization, engineering, test equipment, scanning electron microscopy, yield management, technology product development, optical microscopy, research and development
Experience

defect inspection and metrology engineer
wolfspeed

process engineer
globalfoundries
Defect inspection and review, recipe creation for BF and DF inspection and SEM review, new tool H2H evaluation and tool selection, inspection strategy and data review and interpretation. New application development for special tool monitors and integrated monitors, capacity planning, tool qualification for the new processes and applications.

application engineer, field service engineer
applied materials

lead engineer
2005 2011 applied materials north america
* Application and HW support for multiple Inspection and Review systems. * Spare parts management. * Continuous Improvement Projects (CIP) and Joint Development Projects (JDP)

asia business group technologist, wafer inspection team leader
applied materials
Project prioritization and manpower assignment. Negotiation with R&D group and local teams for resources allocation and utilization. Customer management, including understanding and addressing of customer's concerns and requests, finding work-around and temporary solutions, follow up till final solution, advanced troubleshooting Tool evaluations on customer site, including objectives and success criteria set-up, recipe creation and troubleshooting at initial step, advice for app. engineers on site, communication between customers, local teams and headquarter. Major accomplishments: Successful tool evaluation and head-to-head competition resulted in first in fab tools in two sites in Taiwan. Successful long term head-to-head competition resulted in repeat orders in Taiwan and Korea.

engineer technician
intel corporation
Process and Equipment tech, Defect Metrology. PM/CM, basic troubleshooting. Recipe creation for BF/DF/Surfscan inspection tools
Education
technion - israel institute of technology
chemical engineering
lev makutonin's Contact Information
Phone
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