Lee-eun Yu
Staff Design Engineer @ Micron Technology
About
- 3D NAND Flash Circuit Design Engineer - Performance improvement for 2D and 3D NAND Flash devices - Page buffer and row decoder design for 3D NAND Flash - Abundant hands-on experience with NAND Flash testing, C/C++ and script language programming
United States
San Jose
Semiconductors
C/C++ Programming, HSPICE, Script Language (TCL), NCSIM, Chip Testing using P300 (FPGA-based NAND test solution), Magnum Programming, Mass Data Management Tool (Spotfire)
Experience

Junior Design Engineer
South Korea
- NAND core design engineer - 72-, 48-, 36-Layer TLC 3D NAND Flash performance improvement - Set up P300 based chip-level testing environments using C/C++ programming - Executed extensive chip-level testing focused on performance optimization - Fundamental technology development for NAND Flash performance enhancement including bit line’s current consumption estimation method, programmed Vth distribution estimation tool, innovative program pulse shape for improved performance
Education
Lee-eun Yu's Contact Information
Phone
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