Kenichi Abe
Principal Engineer @ Samsung Electronics
About
I have R&D experience in CMOS Image Sensor (CIS) including medium and long term research topics, and diverse work experience in 2D and 3D NAND flash memory design including physical verification, PDK drafting and improvement, TCAD, row drivers and column sense amplifier circuit design. Especially for NAND flash memory, I’ve been involved in all aspects of the project from the start to the transfer to mass production, including concept design, detailed design, verification, chip evaluation, and defect analysis at the start of mass production.
Japan
Tokyo
Semiconductors
SPICE (ソフトウェア), pixel, Semiconductors, Research and Development (R&D), Image Sensors, NAND Flash, Nanotechnology, Integrated Circuit Design, TCAD, Failure Analysis, Semiconductor Device, LSI
Experience
Principal Engineer
Samsung Electronics
日本 神奈川県 横浜
Staff Engineer
Samsung Electronics
日本 神奈川県 横浜
Engaged in work related to R&D of devices and processes for image sensors.
Senior Image Sensor Engineer
Huawei Technologies Japan K.K.
Tokyo, Japan
Medium- to long-term R&D work focusing on CMOS image sensors
Specialist in non-volatile memory design
Toshiba Memory Corporation
Yokohama, Kanagawa, Japan
I was in charge of the following works for the initial study of next-generation 3D NAND flash memory. 1. TEG design for cell evaluation and process examination 2. Circuit design for cell array drive system 3. Drafting of specifications for the main operation modes such as read, program, and erase of the product, and discussions with related departments
Non-volatile memory designer
Toshiba Corporation
Yokohama, Kanagawa, Japan
Mother product design and mass production launch support for the last generation of planar NAND flash memory. Formulation of development policy and prototype design for 3D NAND flash memory.
Education
Tohoku University
Electrical and Electronics Engineering
Studied on statistical analysis for random telegraph noise and its reduction method
Tohoku University
Electrical and Electronics Engineering
Studied on statistical evaluation for characteristic variations such as threshold voltage and S-factor in scaled MOSFETs
Tohoku University
Electrical and Electronics Engineering
Kenichi Abe's Contact Information
Phone
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